廠牌:日東精工分析科技
供應商:翔貿儀器有限公司 中央製作所 台灣總代理
聯絡電話:04-22922214
快速詢價 |
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商品規格 |
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商品名稱: |
低阻抗率計 MCP-T370型 (手提式) |
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特色: |
維持安定之高品質,依據世界唯一之四探針理論之高精度之阻抗率計。操作簡單,現場使用攜帶型方便,用於生產技術、品質管理 |
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測定範圍: |
10-2~106Ω |
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資料輸出: |
USB Memory |
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尺寸: |
約 228 L× 85 W× 65 Hmm, 420g |
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標準配備 |
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ASP探頭 MCP-TP03P (RMH110)《四探針探頭》 利用價值廣泛標準探頭JIS K7194對應, |
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MCP-TA06 充電器 |
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選購品 |
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ESP探頭 MCP-TP08P (RMH114)《四探針探頭》 不均一樣品用 |
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PSP探頭 MCP-TP06P (RMH112)《四探針探頭》 小樣品或薄膜用 |
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BSP探頭 MCP-TP05P (RMH111)《四探針探頭, 特殊用探頭》 大樣品用 |
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LSP探頭 MCP-TPLSP (RMH116)《四探針探頭, 特殊用探頭》 Soft surface samples用 (RMH116)
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AP2探頭 MCP-TPAP2 (RMH333)《二探針探頭》
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BP探頭 MCP-TPBP (RMH118)《二探針探頭》 大樣品用 |
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ASP探頭 MCP-TP03P(RMH110)《四探針探頭》 利用價值廣泛標準探頭JIS K7194對應, |
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QP2探頭 MCP-TPQP2(RMH119)《四探針探頭》 微小樣品用 |
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TFP探頭 MCP-TFP(RMJ217)《四探針探頭, 特殊用探頭》 Thin films on Si wafer用 |
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NSCP探頭 MCP-NSCP(RMJ202)《四探針探頭, 特殊用探頭》 Silicone wafer用 |
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MCP-TRF1(RMH304) 探頭檢驗片 ASP, ESP,LSP探頭用 (探頭檢驗片於測定前檢查之) |
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MCP-TRPS (RMH311) 探頭檢驗片 PSP探頭用 (探頭檢驗片於測定前檢查之) |
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MCP-TRT2 (RMH335) 探頭檢驗片 AP2,BP探頭用 (探頭檢驗片於測定前檢查之) |
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MCP-TRTF (RMH312) 探頭檢驗片 TFP, NSCP探頭用 (探頭檢驗片於測定前檢查之) |
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MCP-TRQP2 (RMH313) 探頭檢驗片 QP2探頭用 (探頭檢驗片於測定前檢查之) |
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MCP-T370 Loresta-AX 4 Terminal 4 Pin Method The contact resistance between sample and probe is excluded. Accurate measurement is realized by this method. Pin pressure, pin interval and pin diameter are maintained constant by using the MCP probe which adopted the spring contact mechanism. |
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Standard Configuration |
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Type of Measurement: |
MCP-T370 Loresta-AX |
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Features: |
Measurement can be done automatically in “Auto Hold” mode by just pushing the Start key. The Nickle Hydrogen Battery is adopted to the system. Portable operation is possible. The battery pack can be changed by very easy operation. Probe check Mode on the software was adopted. The accuracy of the Loresta-AX main unit and the probe can be checked by using the Probe Checker(not included in the standard set). Measurement data can be output to USB memory. |
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Range: |
10-2~106Ω |
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Data Output: |
USB Memory |
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Dimention&Weight: |
228 L× 85 W× 65 Hmm, 420g |
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Standard equipment |
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ASP MCP-TP03P (p/n RMH110) Standard, Pin Interval 5mm, Pin Top 0.37R ×4 pins Pushing Pressure 210g/Pin |
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MCP-TA06 Adaptar |
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Option |
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ESP MCP-TP08P (p/n RMH114) For non homogeneous samples, Pin Interval 5mm, Pin Top ψ2 × 4 pins Pushing Pressure 240g/Pin |
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PSP MCP-TP06P (p/n RMH112) For small samples, Pin Pitch 1.5mm, Pin Points 0.26R × 4 pins Spring pressure 70g/Pin |
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BSP MCP-TP05P(p/n RMH111) For very large samples, Pin pitch 2.5mm Pin points 0.37R × 4pins Spring pressure 210g/pin |
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LSP MCP-TPLSP (p/n RMH116) For soft surface samples, Pin pitch 5mm Pin top hemisphere 2mm × 4pins Spring pressure 130g/pin |
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AP2 MCP-TPAP2 (p/n RMH333)
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BP MCP-TPBP (p/n RMH118) Resistance by 2 parts: Each part has apin, In interval free, Pin top ψ2 × 2 pins Pushing pressure 240g/Pin |
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ASP MCP-TP03P (p/n RMH110) Standard, Pin Interval 5mm, Pin Top 0.37R ×4 pins Pushing Pressure 210g/Pin |
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QP2 MCP-TPQP2 (RMH119) For very small samples, Pin pitch 1.5mm Pin points 0.26R × 4pins Spring pressure 70g/pin |
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TFP MCP-TFP (PMJ217) For thin films on Si Wafer, Pin pitch 1.0mm In points ψ0.15 × 4pins Spring pressure 50g/pin |
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NSCP MCP-NSCP (PMJ202) For Silicon Wafer, Pin pitch 1.0mm In points ψ0.04 × 4pins Spring pressure 250g/pin |
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MCP-TRF1 (p/n RMH304) Linear 4 Pins, 1Ω For ASP, ESP, LSP Probes |
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MCP-TRPS (p/n RMH311) Linear 4 Pins, 1Ω, for PSP probe |
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MCP-TRT2 (p/n RMH335) 2 Pins, 1Ω, For AP2 probes |
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MCP-TRTF(p/n RMH312) TFP, NSCP |
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MCP-TRQP2 (p/n RMH313) 4 Pins, 1Ω, For QP2 probes |
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