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MCP-T370 低阻抗率計 MCP-T370型 (手提式)

MCP-T370

低阻抗率計 MCP-T370型 (手提式)

Loresta-AX

廠牌:日東精工分析科技
供應商:翔貿儀器有限公司 中央製作所 台灣總代理
聯絡電話:04-22922214
定價:與我們聯絡

快速詢價

9773

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低阻抗率計 MCP-T370型 (手提式)-行動條碼QR Code

 

 

 

商品規格

商品名稱:

低阻抗率計 MCP-T370型 (手提式)
Loresta-AX

 

特色:

維持安定之高品質,依據世界唯一之四探針理論之高精度之阻抗率計。操作簡單,現場使用攜帶型方便,用於生產技術、品質管理

 

測定範圍:

10-2~106Ω

 

資料輸出:

USB Memory

 

尺寸:

約 228 L× 85 W× 65 Hmm, 420g

 

 

 

 

標準配備

 

 

ASP探頭

ASP探頭 MCP-TP03P (RMH110)《四探針探頭》

利用價值廣泛標準探頭JIS K7194對應,
Pin間 5mm,Pin尖 0.37R×4支,壓力 210g/支,

 

 

 

MCP-TA06 充電器

 

 

 

 

選購品


 

ESP探頭

ESP探頭 MCP-TP08P (RMH114)《四探針探頭》

不均一樣品用
Pin間 5mm,Pin尖 Ø 2×4支,壓力 240g/支,


 

PSP探頭

PSP探頭 MCP-TP06P (RMH112)《四探針探頭》

小樣品或薄膜用
Pin間 1.5mm,Pin尖 0.26R×4支,壓力 70g/支,


 

BSP探頭

BSP探頭 MCP-TP05P (RMH111)《四探針探頭, 特殊用探頭》

大樣品用
Pin間 2.5mm,Pin尖 0.37R×4支,壓力 210g/支


 

TFP探頭

 

LSP探頭 MCP-TPLSP (RMH116)《四探針探頭, 特殊用探頭》

Soft surface samples用 (RMH116)
Pin間 5.0mm,Pin尖 2mm×4支,壓力 130g/支

 


 

AP2探頭

AP2探頭 MCP-TPAP2 (RMH333)《二探針探頭》

 


 

B探頭

BP探頭 MCP-TPBP (RMH118)《二探針探頭》

大樣品用
Pin尖 Ø 2×2支,壓力 240g/支


 

B探頭

ASP探頭 MCP-TP03P(RMH110)《四探針探頭》

利用價值廣泛標準探頭JIS K7194對應,
Pin間 5mm,Pin尖 0.37R×4支,壓力 210g/支,


 

B探頭

QP2探頭 MCP-TPQP2(RMH119)《四探針探頭》

微小樣品用
Pin間 1.5mm,Pin尖 0.26R×4支,壓力 70g/支,


 

B探頭

TFP探頭 MCP-TFP(RMJ217)《四探針探頭, 特殊用探頭》

Thin films on Si wafer用 
Pin間 1.0mm,Pin尖 0.15R×4支,壓力 50g/支


 

B探頭

NSCP探頭 MCP-NSCP(RMJ202)《四探針探頭, 特殊用探頭》

Silicone wafer用 
Pin間 1.0mm,Pin尖 0.04R×4支,壓力 250g/支


 

ESP探頭

MCP-TRF1(RMH304) 探頭檢驗片

ASP, ESP,LSP探頭用 (探頭檢驗片於測定前檢查之)


 

PSP之探頭檢驗片

MCP-TRPS (RMH311) 探頭檢驗片

PSP探頭用 (探頭檢驗片於測定前檢查之)


 

TFP, NSCP之探頭檢驗片

MCP-TRT2 (RMH335) 探頭檢驗片

AP2,BP探頭用 (探頭檢驗片於測定前檢查之)


 

TFP, NSCP之探頭檢驗片

MCP-TRTF (RMH312) 探頭檢驗片

TFP, NSCP探頭用 (探頭檢驗片於測定前檢查之)


 

TFP, NSCP之探頭檢驗片

MCP-TRQP2 (RMH313) 探頭檢驗片

QP2探頭用 (探頭檢驗片於測定前檢查之)


 


 MCP-T370 Loresta-AX

4 Terminal 4 Pin Method

The contact resistance between sample and probe is excluded. Accurate measurement is realized by this method.

Pin pressure, pin interval and pin diameter are maintained constant by using the MCP probe which adopted the spring contact mechanism.

 

 Standard Configuration

Type of Measurement

MCP-T370 Loresta-AX

 

Features

Measurement can be done automatically in “Auto Hold” mode by just pushing the Start key.

The Nickle Hydrogen Battery is adopted to the system. Portable operation is possible. The battery pack can be changed by very easy operation.

Probe check Mode on the software was adopted. The accuracy of the Loresta-AX main unit and the probe can be checked by using the Probe Checker(not included in the standard set).

Measurement data can be output to USB memory.

 

Range

10-2~106Ω

 

Data Output

USB Memory

 

Dimention&Weight

228 L× 85 W× 65 Hmm, 420g

 

 

 

 

 

 Standard equipment

 

 

ASP探頭

ASP MCP-TP03P (p/n RMH110)

Standard, Pin Interval 5mm,

Pin Top 0.37R ×4 pins

Pushing Pressure 210g/Pin

 

 

 

MCP-TA06 Adaptar

 

 

 

 

 Option


 

ESP探頭

ESP MCP-TP08P (p/n RMH114)

For non homogeneous samples,

Pin Interval 5mm,

Pin Top ψ2 × 4 pins

Pushing Pressure 240g/Pin


 

PSP探頭

PSP MCP-TP06P (p/n RMH112)

For small samples,

Pin Pitch 1.5mm,

Pin Points 0.26R × 4 pins

Spring pressure 70g/Pin


 

BSP探頭

BSP MCP-TP05P(p/n RMH111)

For very large samples,

Pin pitch 2.5mm

Pin points 0.37R × 4pins

Spring pressure 210g/pin


 

TFP探頭

 

LSP MCP-TPLSP (p/n RMH116)

For soft surface samples,

Pin pitch 5mm

Pin top hemisphere

2mm × 4pins

Spring pressure 130g/pin


 

A探頭

AP2 MCP-TPAP2 (p/n RMH333)

 


 

B探頭

BP MCP-TPBP (p/n RMH118)

Resistance by 2 parts: Each part has apin,

In interval free,

Pin top ψ2 × 2 pins

Pushing pressure 240g/Pin


 

B探頭

ASP MCP-TP03P (p/n RMH110)

Standard, Pin Interval 5mm,

Pin Top 0.37R ×4 pins

Pushing Pressure 210g/Pin


 

B探頭

QP2 MCP-TPQP2 (RMH119)

For very small samples,

Pin pitch 1.5mm

Pin points 0.26R × 4pins

Spring pressure 70g/pin


 

B探頭

TFP MCP-TFP (PMJ217)

For thin films on Si Wafer,

Pin pitch 1.0mm

In points ψ0.15 × 4pins

Spring pressure 50g/pin


 

B探頭

NSCP MCP-NSCP (PMJ202)

For Silicon Wafer,

Pin pitch 1.0mm

In points ψ0.04 × 4pins

Spring pressure 250g/pin


 

ESP探頭

MCP-TRF1 (p/n RMH304)

Linear 4 Pins, 1Ω

For ASP, ESP, LSP Probes


 

PSP之探頭檢驗片

MCP-TRPS (p/n RMH311)

Linear 4 Pins, 1Ω,

for PSP probe


 

TFP, NSCP之探頭檢驗片

MCP-TRT2 (p/n RMH335)

2 Pins, 1Ω,

For AP2 probes


 

TFP, NSCP之探頭檢驗片

MCP-TRTF(p/n RMH312)

TFP, NSCP


 

TFP, NSCP之探頭檢驗片

MCP-TRQP2 (p/n RMH313)

4 Pins, 1Ω,

For QP2 probes


 

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